X-Ray Fluorescence Spectroscopy for Laboratory Applications
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Author: Haschke, Michael / Flock, Jorg / Haller, Michael Publisher: VCH ISBN: 9783527344635 Cover: HARDCOVER Date: 2021年02月 こちらの商品は学校・法人様向け(機関契約)のオンラインブック版がございます。 オンラインブックの価格、納期につきましては弊社営業員または当ECサイトよりお問い合わせください。 DESCRIPTION Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. * An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses * Focuses on daily laboratory work with commercially available devices * Offers a unique compilation of knowledge and best practices from equipment manufacturers and users * Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers. TABLE OF CONTENTS Introduction Basics of X-Ray Spectrometry Sample Preparation Instrument Types for XRF Acqusition and Evaluation of X-Ray Spectra Analytical Errors Other Element Analytical Methods Radiation Protection Analysis of Homogeneous Materials Analysis of Powders Analysis of Liquids Trace Analysis with Total Reflection X-Ray Spectrometry Non-Homogeneous Samples Analysis of Layer Systems Analysis of Small Sample Areas Determination of Element Distributions Special Applications of XRF Process Control and Automation Quality Management and Method Validation
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