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Quantitative Depth Profiling and Diffusion in Thin Films
◆World Scientific 年末セール開催中！：2025年12月21日(日)ご注文分まで
※上記表示の販売価格は割引適用後の価格です 出版済み 3-5週間でお届けいたします。 Title: Quantitative Depth Profiling and Diffusion in Thin Films Author: Jiangyong Wang et al. Publisher: World Scientific ISBN: 9789819811922 Cover: HARDCOVER Date: 2025年07月 DESCRIPTION This book is dedicated to the fields of quantitative depth profiling, diffusion, and surface segregation in thin solid films. It contains a curated collection of original research papers and authoritative reviews that address the latest theoretical advancements and practical applications related to the aforementioned fields. The book is structured into three parts, each offering in-depth insights into its respective field. The first part concentrates on the quantitative analysis of depth profiling data, particularly on the application of the traditional and extended Mixing-Roughness-Information (MRI) model. It explores the theoretical fundamentals and practical implementations of depth profiling techniques, providing a thorough understanding of how the MRI model enhances the analysis of thin solid films. The second part shifts focus to the diffusion phenomena in thin solid films, examining the temperature dependence and the activation energy of the interdiffusion coefficient. It elucidates the impact of diffusion processes on the performance and reliability of materials in real-world applications. The third part delves into surface segregation, discussing the equilibrium and kinetic segregation in binary alloy thin films. It highlights the Modified Darken model and explores the influence of strain on surface and interface segregation in ultrathin alloy films. Suitable for scientists, engineers, and professionals, this book serves as a fundamental reference and a guide to the latest advancements in thin film analysis. It bridges the gap between theory and practice, offering readers the tools necessary for effective quantification and analysis in the ever-evolving field of materials science. TABLE OF CONTENTS Introduction: Introduction to the Application and Significance of Thin Films Significance of Depth Profiling Significance of Surface/Interface Segregation Quantitative Depth Profiling in Thin Films: Mixing-Roughness-Information (MRI) Model Extensions of the MRI Model Applications of the MRI Model Summary Diffusion in Thin Films: Introduction to Diffusion Phenomena in Thin Films Methodologies for Determination of Interdiffusion Coefficient Effects of Sputtering-Induced Artifacts on Diffusivity Measurement Case Studies on Quantitative Interdiffusion Summary Segregation in Thin Films: Introduction to Segregation in Thin Film Modified Darken Model for Segregation Analysis Determination of Segregation Energy and Interaction Parameter Surface Segregation in Binary Alloy Thin Films Stress-Induced Segregation in Ultrathin Alloy Films Summary
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