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Transmission Electron Microscopy, 2nd ed. 2009出版済み 3週間でお届けいたします。
Title: Transmission Electron Microscopy, 2nd ed. 2009 Author: Williams, David B. / Carter, C. Barry Publisher: Springer ISBN: 9780387765006 Cover: HARDCOVER Date: 2009年09月 DESCRIPTION この草分け的な教科書は，この分野で世界をリードするものとして作成された．全体にわたりフルカラーの図表で満ちあふれた本書は，この多用途で強力な材料を特徴付ける透過型電子顕微鏡の技法の実際の応用のために必要な洞察とガイドを提供している．12 年ぶりの改訂にあたり，数多くの節が完全に書き換えられ，それ以外の節も増補改訂されている．新版にも学生向けの広範囲にわたる800 題におよぶ自習問題と400 題以上の演習問題が含まれている． 主な特徴 * 疑いなく市場のリーダーであり，第2 版として完全に増補改訂 * 学部上級生や大学院生レベルの講義テキスト，材料科学者の手軽な参考資料として最適 * 透過型電子顕微鏡が使われるべき理由とどのように実際に用いるかを説明 * 700 にもおよぶ図表，ほとんどがフルカラー This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated now in full color throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Praise for the first edition: "The best textbook for this audience available." American Scientist "…highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!" Microscopy and Microanalysis "This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student." Micron "The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference…This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project." MRS Bulletin, May 1998 "The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years….The authors can be proud of an enormous task, very well done." from the Foreword by Professor Gareth Thomas, University of California, Berkeley TABLE OF CONTENTS Basics The Transmission Electron Microscope Scattering and Diffraction Elastic Scattering Inelastic Scattering and Beam Damage Electron Sources Lenses, Apertures, and Resolution How to ‘See’ Electrons Pumps and Holders The Instrument Specimen Preparation Diffraction Diffraction in TEM Thinking in Reciprocal Space Diffracted Beams Bloch Waves Dispersion Surfaces Diffraction from Crystals Diffraction from Small Volumes Obtaining and Indexing Parallel-Beam Diffraction Patterns Kikuchi Diffraction Obtaining CBED Patterns Using Convergent-Beam Techniques Imaging Amplitude Contrast Phase-Contrast Images Thickness and Bending Effects Planar Defects Imaging Strain Fields Weak-Beam Dark-Field Microscopy High-Resolution TEM Other Imaging Techniques Image Simulation Processing and Quantifying Images Spectrometry X-ray Spectrometry X-ray Spectra and Images Qualitative X-ray Analysis and Imaging Quantitative X-ray Analysis Spatial Resolution and Minimum Detection Electron Energy-Loss Spectrometers and Filters Low-Loss and No-Loss Spectra and Images High Energy-Loss Spectra and Images Fine Structure and Finer Details
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